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Layer Release

EV Group Doubles Throughput of Innovative Semiconductor Layer Transfer Technology

The dedicated HVM EVG®880 LayerRelease™ system boosts productivity and lowers the cost-of-ownership of novel infrared laser release technology through silicon carrier wafers for 3D integration applications EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology, and semiconductor markets, today introduced the EVG®880 LayerRelease™...

When Plasma Matters

As the company boasts some of the most advanced plasma equipment in the industry, CCO Peter Dijkstra discusses how Trymax Semiconductor Equipment B.V. (Trymax) has achieved this unique position. Amongst many titans of the semiconductor manufacturing industry in the Netherlands, Trymax Semiconductor Equipment B.V. (Trymax) is the company of choice...

Novati’s Integrated Sensor Platform Brings It all Together

A few weeks ago, Tezzaron announced its latest industry first: an eight-layer 3D IC wafer stack containing active logic, built at its fab, Novati Technologies, a global nanotechnology development center located in Austin, TX.  Novati is clearly on a roll, because today they added another industry first to their product...

3D TSV Test Approaches: Outlook for 2014

Metrology, process control, and electrical test are key enablers for the success of the semiconductor industry. 3D integration using TSVs offers new challenges in this area that need solutions. There seems to be industry consensus that it is extremely difficult to perform a wafer-level test that ensures the complete functionality of...

EV Group Unveils New Via-Filling Process to Improve Reliability of 3D-IC / TSV Packaging

Semicon Taiwan, Taipei, September 4, 2013 — EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today unveiled a new polymer via-filling process for 3D-IC/through-silicon-via (TSV) semiconductor packaging applications.  Available on the EVG100 series of resist processing systems, the new...

Cielution thermal modeling

Tips on Modeling Warpage for 3D ICs

This week’s webinar on chip stack assembly simulation, presented by Kamal Karimanal of Cielution offered some useful information on how modeling can be used to minimize warpage in 3D stacking. In 3D stacking, versus traditional flip chip processes, thickness of RDL layers in comparison with the thinned die or wafer can lead...

SPTS Debuts Low-Temperature PECVD Technology for 3D-IC

SPTS Technologies has launched its low temperature plasma-enhanced chemical vapor deposition (PECVD) solution for via-reveal passivation in 3D-IC packaging applications. Already proven in 300mm volume production fabs, the Delta fxP® PECVD system deposits dielectric layers onto bonded substrates at wafer temperatures below 200°C,  with throughputs up to twice that of...

Tips on Modeling Warpage for 3D ICs

This week’s webinar on chip stack assembly simulation, presented by Kamal Karimanal of Cielution offered some useful information on how modeling can be used to minimize warpage in 3D stacking. In 3D stacking, versus traditional flip chip processes, thickness of RDL layers in comparison with the thinned die or wafer can lead...

SEMI International Standards Program Forms 3D Stacked IC Standards Committee

SEMI announced today the formation of a Three-Dimensional Stacked Integrated Circuits (3DS-IC) Standards Committee. 3DS-ICs are composed of a stack of two-dimensional die, and are viewed as critical in helping the semiconductor industry keep pace with Moore’s Law. Current integration methods like wirebond and flip chip have been in production...