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IFTLE 491: IBM Simplifies Si Bridge Technology              

Continuing our coverage of ECTC 2021, let’s take a look at the session on Heterogeneous Integration (HI) using 2.XD/3D packaging, chaired by Subash Shinde of Notre Dame and John Knickerbocker of IBM. IBM Introduces Direct Bonded HI Si Bridge Technology Though they are not manufacturing chips or packages anymore, IBM...

Path Finding Series Part 3: The Cost of Non-robust Design

In previous posts, I discussed a process for process-centering a design. In this post, we will examine how non-robust design’s erratic yields can impact the manufacturing environment and cost of a product. A non-robust design will have at least one specification that is skewed away from the specification’s center as...

Catching up with imec’s Eric Beyne

Eric Beyne (imec) and I go way back. He’s the Scientific Director of Advanced Packaging Technologies at imec, and ever since my Advanced Packaging days, he’s been a valuable resource whenever I have technology questions about any part of the spectrum of 3D integration technologies. Basically, I can count on...

Musings From SEMICON West 2012

Tish LeBlanc, from TI: "How's your SEMICON West going? Me: "I was just trying to put it into words." It's Thursday, and another SEMICON West (my seventh) is winding down, and its the first time I've found time to write since Monday evening. As always, it's been a whirlwind of...

Monolithic 3D: A Basic Primer

Ever since I put on the editorial director hat for 3D-ICs.com, which aggregates 3D technology news, blogs and papers, and categorizes them as either TSV and 3D packaging or monolithic 3D, I’ve been trying to wrap my head around the differences between 3D TSVs and monolithic 3D integration technologies.  I’ve...

SEMATECH to conduct rigorous manufacturability assessments to enable high volume manufacturing readiness of 3D technology

To enable high-volume production readiness of 3D-based products, SEMATECH’s 3D Interconnect and Manufacturability programs will be conducting Equipment Maturity Assessments (EMAs) of several critical 3D tools during 2012 to establish functional equipment capabilities and address high volume manufacturing maturity issues. The assessment is a cooperative effort among experts from SEMATECH’s...

STATS ChipPAC Celebrates Grand Opening of 300mm eWLB Facility

The official inauguration of STATS ChipPAC’s 300mm eWLB facility was held September 15, at the company's Yishun facility in Singapore with more than 150 local dignitaries, customer representatives, business partners and management participating. In April of 2010, STATS ChipPAC established itself as the first in the world to implement 300mm...