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Bridging the Interconnect Pitch Gap Calls for 3D Technologies

Last week at IWLPC, keynote speaker, Doug Yu, TSMC, kicked off the event with a similar storyline used by ASE’s Tien Wu during his IMAPS Symposium keynote earlier this month: High-performance applications like artificial intelligence (AI), 5G, autonomous driving, and even high-end smartphones are driving the continuation of Moore’s Law...

Why We need Lower Cost TSVs and How to Get Them

Through-silicon vias (TSVs) have been firmly established as a method of interconnect that enables high bandwidth and low latency between dies at extremely low power dissipation. Used for years in microelectromechanical systems (MEMS), compound semiconductors, and image sensors, TSVs are now also in mainstream production for 2.5D interposer technologies, and...

Taking Stock and Redefining the Heterogeneous Integration Roadmap at IMAPS DPC 2018

As it has for the past 14 years, the global microelectronics industry gathered at Wekopa Resort and Conference Center in Fountain Hills, AZ, March 6-8, 2018, for the 2018 IMAPS Device Packaging Conference (DPC) to share knowledge, discuss strategies for growth, learn about the latest heterogeneous integration from fan-out wafer...

TechSearch International Analysis Examines FO-WLP Developments and Sensor Packaging Trends

Mobile devices, specifically smartphones, represent the single greatest volume driver for MEMS and other sensors today. Sensors found in these products include electronic compasses, motion sensors, barometers, microphones, and fingerprint sensors. Package types include land grid arrays (LGAs), lead frame packages such as QFNs, and wafer level packages (WLPs.). Apple...

Multiple Orders for Rudolph’s Firefly Inspection System Marks Early Success

 Wilmington, Mass. (May 1, 2017) Rudolph Technologies, Inc. (NYSE: RTEC) announced today that two of the industry’s leading suppliers of advanced packaging services have purchased multiple Firefly™ Inspection Systems. The Firefly System, with Rudolph’s patented Clearfind™ Technology, can detect defects that are almost impossible to find using conventional imaging techniques...

Executive Viewpoint: Why the European 3D Summit is Going Beyond TSVs

Remember back a few years ago when 3D and TSV were considered to be the pretty much the same thing? Anne-Marie Dutron, general director of SEMI Europe Grenoble Office does. She was in the thick of it, working at ST Microelectronics Mobile Division in partnership with CEA-Leti and imec on...