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SkyWater Enters License Agreement with Xperi for Hybrid Bonding Technology

Hybrid bonding capability strongly complements SkyWater’s developing portfolio of heterogeneous integration solutions including silicon interposer and fan-out packaging KISSIMMEE, Fla. and SAN JOSE, Calif. – May 12, 2022 – SkyWater Technology (NASDAQ: SKYT), the trusted technology realization partner, and Adeia, the newly launched brand for the IP licensing business of Xperi Holding Corporation (NASDAQ: XPER)...

IFTLE 443: Controlling Warpage and Placement Error for FOWLP

In the Jan/Feb issue of ChipScale Review, there were two interesting articles on fan-out wafer-level packaging (FO-WLP) entitled “Eliminating Warpage for FOWLP during Debonding” by ERS Electronic GmbH and “Overcoming FOPLP Die Placement Error” by Onto Innovation …lets take a closer look. Eliminating Warpage for FOWLP during Debonding As we...

Trymax Receives Multi-System Orders from a Top Ten OSAT

NIJMEGEN, THE NETHERLANDS – May 15, 2019. Trymax Semiconductor Equipment BV (Trymax), a global leader in plasma solutions, today announced it has received multi-system orders for its NEO 2000 and NEO 3000 series from a top ten OSAT based in Taiwan. This order will expand the existing NEO install base...

iPhone 7: Apple Charts a Strategic Course by Selecting TSMC’s inFO Platform

Each year, Apple integrates more and more innovative technologies in its iPhone products. This year, with the new iPhone 7 and its A10 processor, the leading company is the first organization to bring out package-on-package (PoP) wafer-level packaging (WLP) at the consumer scale. Apple underwent a strategic change by selecting...

Rudolph Technologies Unveils New Inspection Suite for Front- and Back-end Semiconductor Manufacturing

Rudolph continues to drive the technological innovation of its inspection and metrology products to deliver solutions that address the demanding needs across front- and back-end processes Wilmington, Mass. (September 6, 2016)—Rudolph Technologies, Inc. (NYSE: RTEC) today launched two new inspection and metrology solutions for advanced semiconductor manufacturing: the Firefly™ System...

Intercepting IC Products with a Disruptive Technology Option

Much has been written about the challenges that corporations face – especially established corporations – in adapting to a disruptive technology and the associated paradigm shifts. Most of the tomes on the subject focus on corporate management strategies. My intent is to discuss these challenges from a technology point of view...

Success for 3D: What A Difference a Year Makes

During the 2015 European 3D TSV Summit, I drove attendees to distraction by asking each presenter what success looked like to them for 3D integration. The resulting responses became a blog post, What Does Success for 3D Integration Look Like? Now, a year later, I decided to revisit the topic by...

Measuring The Invisible: An Update on X-ray Metrology

One year ago, I visited Nordson DAGE at its R&D center in Colchester, to learn about the company’s latest foray into X-ray metrology at the production level with the launch of the XM8000. Rather than just using X-ray for inspection, this tool also analyzes the data to allow for full...

2021 3D InCites Awards Winner Circle

The 2021 3D InCites Awards program recognized industry-wide contributions in the development of heterogeneous integration and 3D technologies.  We expanded our scope of coverage, adding a special focus on sustainable manufacturing efforts, as well as diversity equity and inclusion (DEI) with two special award categories. Like every other awards event in the...