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IFTLE 539: IMAPS On-Shore Packaging & Assembly Workshop; TSMC 3DFabric Alliance

As we mentioned in IFTLE 537, IMAPS held the Onshoring: Packaging and Assembly Workshop prior to the traditional IMAPS fall symposium. Let’s take a look at what we learned from some of those key presentations. And then we’ll look at an important announcement by TSMC about its 3DFabric Alliance. Intel...

ESTC 2022 Member Company Preview

Chaired by 3D InCites Community member Steffen Kröhnert of ESPAT Consulting, the Electronics System-Integration Technology Conferences (ESTC) series is a premier venue for academics and industry to present and discuss the latest developments in assembly and interconnection technology and new applications. This year, the event is being held in Sibiu,...

IFTLE 443: Controlling Warpage and Placement Error for FOWLP

In the Jan/Feb issue of ChipScale Review, there were two interesting articles on fan-out wafer-level packaging (FO-WLP) entitled “Eliminating Warpage for FOWLP during Debonding” by ERS Electronic GmbH and “Overcoming FOPLP Die Placement Error” by Onto Innovation …lets take a closer look. Eliminating Warpage for FOWLP during Debonding As we...

IFTLE 437: Packaging Trends for Artificial Intelligence

As it has in recent years, SEMICON Europa 2019  featured a dedicated Advanced Packaging Conference. In this and my next post, we will look at some of the key presentations. In Jan Vardaman’s TechSearch presentation “Packaging Trends for Artificial Intelligence (AI)” she noted that the following package types would be...

Welcome to a New Era of Predictive Yield Process Control for Advanced Packaging

In April 2016, Fogale Nanotech Group acquired the assets of Altatech Semiconductor from Soitec in order to combine the metrology offerings of Fogale Nanotech Semicon with Altatech’s unique 2D and 3D inspection capabilities. The idea was to create a powerhouse of process control for emerging advanced packaging processes for next-generation...

Intercepting IC Products with a Disruptive Technology Option

Much has been written about the challenges that corporations face – especially established corporations – in adapting to a disruptive technology and the associated paradigm shifts. Most of the tomes on the subject focus on corporate management strategies. My intent is to discuss these challenges from a technology point of view...

Measuring The Invisible: An Update on X-ray Metrology

One year ago, I visited Nordson DAGE at its R&D center in Colchester, to learn about the company’s latest foray into X-ray metrology at the production level with the launch of the XM8000. Rather than just using X-ray for inspection, this tool also analyzes the data to allow for full...

Lithography Challenges for 2.5D Interposer Manufacturing

In recent years, 2.5D packaging has quickly gained acceptance as an advanced packaging process, and the first products using this technology are now coming to market.¹ Most estimates project growth for 2.5D interposer packaging faster than the industry as a whole. Similar to the multi-chip modules (MCMs) of the past,...

2021 3D InCites Awards Winner Circle

The 2021 3D InCites Awards program recognized industry-wide contributions in the development of heterogeneous integration and 3D technologies.  We expanded our scope of coverage, adding a special focus on sustainable manufacturing efforts, as well as diversity equity and inclusion (DEI) with two special award categories. Like every other awards event in the...