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May Member News

May Member News: Strategic Moves, Product Launches, Sustainability and more

May member news showcases significant strides in advancing semiconductor technologies and fostering sustainability efforts. From strategic divestitures and innovative product launches to educational initiatives and workforce development programs, the semiconductor industry continues to evolve and thrive. Dive into the latest updates from our member companies and stay informed about the...

Talking about Neural Networks and SoC Design Challenges

Once a month, MEPTEC, now managed by Ira Feldman, organizes a very informative luncheon at SEMI in Milpitas. On November 13, 2019, two well-known industry experts, Anand Joshi and Tom Dillinger, addressed today’s hot topics —neural networks and System-on-Chip (SoC) design challenges — with short, but very informative presentations. Can...

IMAPS 2014

3D Technology Snapshots from IMAPS 2014

This year’s IMAPS International Symposium purported to have “the most interposer and 3D content under one roof.” I’m not sure about that, but there was certainly enough 3D going on at IMAPS 2014 to spark my interest. Here are some highlights I came away with, based on presentations, interviews with...

Next-Gen MEMS Simulation Tool Makes Life Easier for ASIC Designers

I don’t usually write about MEMS. But every once in a while, when MEMS (stands for micro-electromechanical systems) touches anything to do with 3D integration, usually at the system-level, I might veer slightly out of my comfort zone to interview a MEMS supplier about their latest developments. I find it’s...

Rudolph Receives Volume Purchase Order from Major Taiwan OSAT for 2D/3D Inspection Systems

Flanders, New Jersey (August 11, 2014)—Rudolph Technologies, Inc. announced today that it has received a large order from one of Taiwan’s providers of independent semiconductor manufacturing services in assembly and test (OSAT) for 2D/3D inspection systems. The order includes: multiple NSX® systems for two-dimensional (2D) macro defect inspection, the Wafer...

SETNA: Atmospheric Plasma Surface Modification

This is part of a series of short interviews, based on face-to-face meetings at SEMICON West 2013. SET is known in the 3D IC world for its high accuracy die bonder for die-to-die and die-to-wafer stacking. The SET Representative in North America (SETNA) has also launched a companion tool, ONTOS7,...

Are you pro or con TSV?

Because I interact with people involved in 3D across the entire spectrum of its meaning, I tend to be privy to varied perspectives and opinions when it comes to the adoption of TSV as a method of interconnect for 3D integration. One thing is perfectly clear – support for TSV...

3D from all angles at DATE 2009 3D workshop

As I was unable to attend Design Automation Test in Europe (DATE 2009) myself, but felt the information being shared there would be useful to my readers, I asked fellow 3D enthusiast, Yann Guillou, new technology marketing, St Ericsson, if he would write a guest post for “Françoise in 3D”....