ICYMI: Comet’s Isabella Drolz Explains How 3D X-Ray Uses AI to Help Build AI Chips
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Send us a text In this episode, Francoise von Trapp speaks with Isabella Drolz from Comet about how AI is revolutionizing semiconductor inspection strategies, particularly in 3D X-ray systems. They discuss how AI is being used to find structural defects in advanced chip packages, and also how 3D inspection is being used to develop advanced […]