Nordson Test & Inspection’s Chris Rand Explains Approaches to Achieving Zero Defects in Microelectronics Devices Using X-Ray Inspection
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This week’s episode dives deep into the world of X-ray inspection and its many uses in today’s high-density 3D heterogeneous integration technologies for semiconductor manufacturing. Françoise von Trapp speaks with subject matter expert, Chris Rand, of Nordson Test and Inspection. You’ll learn the basics – how X-ray inspection is used in semiconductor manufacturing and how […]