Julius Hållstedt

About Julius

Julius Hållstedt has worked with the development, implementation and market introduction of various X-ray analytical solutions utilizing methods such as XRD, XRF, SAXS and SCD since 2009. He is currently head of segment for  semiconductor/electronics inspection at Excillum. He received his M. Sc. degree in materials science and his Ph. D. degree in solid-state electronics from the Royal Institute of Technology (KTH), Stockholm, Sweden, in 2002 and 2007 respectively.